Key Metrics
Journal Specifications
- PublisherAMER SOC PHOTOGRAMMETRY
- LanguageEnglish
- FrequencyMonthly
- LanguageEnglish
- FrequencyMonthly
- Publication Start Year1934
- Website URL
Topics Covered
Year-wise Publication
- 5Y
- 10Y
FAQs
Since when has Photogrammetric Engineering and Remote Sensing been publishing? 
The Photogrammetric Engineering and Remote Sensing has been publishing since 1934 till date.
How frequently is the Photogrammetric Engineering and Remote Sensing published? 
Photogrammetric Engineering and Remote Sensing is published Monthly.
Who is the publisher of Photogrammetric Engineering and Remote Sensing? 
The publisher of Photogrammetric Engineering and Remote Sensing is AMER SOC PHOTOGRAMMETRY.
How can I view the journal metrics of Photogrammetric Engineering and Remote Sensing on editage? 
For the Photogrammetric Engineering and Remote Sensing metrics, please refer to the section above on the page.
What is the eISSN and pISSN number of Photogrammetric Engineering and Remote Sensing? 
The eISSN number is 2374-8079 and pISSN number is 0099-1112 for Photogrammetric Engineering and Remote Sensing.
What is the focus of this journal? 
The journal covers a wide range of topics inlcuding Point cloud, Remote sensing, Time series, Digital elevation model, Structure from motion, Hyperspectral image classification, Impervious surface.
Why is it important to find the right journal for my research? 
Choosing the right journal ensures that your research reaches the most relevant audience, thereby maximizing its scholarly impact and contribution to the field.
Can the choice of journal affect my academic career? 
Absolutely. Publishing in reputable journals can enhance your academic profile, making you more competitive for grants, tenure, and other professional opportunities.
Is it advisable to target high-impact journals only? 
While high-impact journals offer greater visibility, they are often highly competitive. It's essential to balance the journal's impact factor with the likelihood of your work being accepted.